We are excited to share that our paper is now accessible in early access in the IEEE Journal of Solid-State Circuits (JSSC)!
The article, titled “A Low-Noise Digital PLL with an Adaptive Common-Mode Resonance Tuning Technique for Voltage-Biased Oscillators”, presents an in-depth analysis and extended results of the work we previously presented at the 2025 IEEE International Solid-State Circuits Conference (ISSCC).
This work introduces a new background calibration technique for voltage-biased oscillators, capable of optimizing their phase-noise performance across the entire tuning range by adaptively adjusting the ratio between common-mode and differential-mode capacitance.
The test chip, fabricated in a 28-nm CMOS process, achieves 45.8-fs integrated jitter and −146.6-dBc/Hz phase noise at 10-MHz offset from a 4.75-GHz carrier.
If you are interested in digital PLLs and digitally controlled oscillator design, you can find the article here: [URL]









